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Materials Science
Particle Analysis Using Electron Microscopy
Particle characterization with scanning electron microscopy for materials analysis applications.
SEM particle analysis
Thermo Scientific Phenom ParticleX and Perception Desktop SEMs deliver a comprehensive plug-and-play SEM-EDS software solution for particle analysis workflows. Featuring automated characterization, verification, and classification of materials, the instruments support your production with fast, accurate, and reliable data that adheres to industry regulations and standards.
Features include:
- Fully integrated particle analysis software with SEM-EDS system
- Certified repeatability and reproducibility
- Compliance with industry standards in technical cleanliness, steel inclusion analysis, and gunshot residue analysis
- Automated, unattended long analysis run time
- Small system footprint with built-in, customizable reporting software
- Local language support and training
- Continuous updates based on the latest technology and your feedback
Electron microscopy particle analysis applications
Technical cleanliness particle analysis
Perform technical cleanliness at the microscale with the multi-purpose Phenom ParticleX TC Desktop SEM.
Steel manufacturing particle analysis
Automate steel inclusion analysis and quickly respond to faults and failures with the Phenom ParticleX Steel Desktop SEM.
Additive manufacturing particle analysis
Analyze samples up to 100 mm x 100 mm and ensure purity at the microscale with the Phenom ParticleX AM Desktop SEM.
Gunshot residue particle analysis
Speed up gunshot residue analysis with the automated, long-lasting Phenom Perception GSR Desktop SEM.
Battery manufacturing materials particle analysis
Effectively trace contaminants in battery materials with the Phenom ParticleX Battery Desktop SEM.
SEM image of a cobalt particle aggregate. Such SEM images can be analyzed and parametrized with a range of Thermo Fisher Scientific software workflows.
SEM image of two particles of cobalt isolated from a powder sample.
Glass particles dispersed on a substrate and imaged at low magnification using SEM.
Grouping of particles from a powder sample, imaged using SEM.
Automated, large-area STEM-EDS data reveals the elemental composition of individual nanoparticles. Data processing performed with Avizo Software. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such as this collection of nanoparticles. Here, color corresponds to particle size; this data can subsequently be quantified and analyzed. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Documents
Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series
In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.
- How to certify your NCM powder quality with SEM+EDS
- Electron-microscope-grade cleanliness in electronics
- Speed up your automated gunshot residue analysis
- Technical cleanliness analysis with an SEM: Why?
- Understand your steel with automated inclusion analysis
- One tool for complete AM powder characterization
SEM image of a cobalt particle aggregate. Such SEM images can be analyzed and parametrized with a range of Thermo Fisher Scientific software workflows.
SEM image of two particles of cobalt isolated from a powder sample.
Glass particles dispersed on a substrate and imaged at low magnification using SEM.
Grouping of particles from a powder sample, imaged using SEM.
Automated, large-area STEM-EDS data reveals the elemental composition of individual nanoparticles. Data processing performed with Avizo Software. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such as this collection of nanoparticles. Here, color corresponds to particle size; this data can subsequently be quantified and analyzed. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Documents
Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series
In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.
- How to certify your NCM powder quality with SEM+EDS
- Electron-microscope-grade cleanliness in electronics
- Speed up your automated gunshot residue analysis
- Technical cleanliness analysis with an SEM: Why?
- Understand your steel with automated inclusion analysis
- One tool for complete AM powder characterization
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