As the demand for high-performance materials increases, so does the importance of surface engineering. The material’s surface is its point of interaction with the external environment and other materials, and will influence factors such as corrosion rates, catalytic activity, adhesive properties, wettability, contact potential, and failure mechanisms.

Surface modification can be used to alter or improve these characteristics; surface analysis is used to understand surface chemistry and investigate the efficacy of surface engineering. From non-stick cookware coatings to thin-film electronics and bio-active surfaces, X-ray photoelectron spectroscopy is one of the standard tools for surface characterization.

X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a technique for analyzing a material’s surface chemistry. XPS can measure elemental composition as well as the chemical and electronic state of the atoms within a material.

Animation of XPS surface analysis.

XPS spectra are obtained by irradiating a solid surface with a beam of X-rays and measuring the kinetic energy of electrons that are emitted from the top 1-10 nm of the material. A photoelectron spectrum is recorded by counting ejected electrons over a range of kinetic energies. The energies and intensities of the photoelectron peaks enable identification and quantification of all surface elements (except hydrogen).
 

Surface characterization

The surface represents a discontinuity between one phase and another; the physical and chemical properties of the surface are, therefore, different from those of the bulk material. These differences affect the topmost atomic layer of the material to a large extent because a surface atom is not surrounded by atoms on all sides. This results in the surface atom having a bonding potential, which makes it more reactive than atoms in the bulk.

Diagram of surface layers that can be analyzed with XPS surface analysis.
A surface layer is defined as being up to three atomic layers thick (~1 nm), depending upon the material. Layers up to approximately 10 nm are considered ultra-thin films, and layers up to approximately 1 μm are thin films. The remainder of the solid is referred to as bulk material. This terminology is not definitive however, and the distinction between the layer types can vary depending upon the material and its application.

Single-instrument, multi-technique XPS workflow

When you look at your sample, do you wonder which analysis technique will get you all the pertinent information you need? Is the answer usually that no one single technique will give you everything you need? To fully understand materials, you need to be able to analyze them using multiple techniques. When you use a single-instrument, multi-technique workflow, you can better expose your sample’s properties by exploring it with a combination of many techniques, including XPS, ISS, REELS, UPS, and Raman. Learn how you can get on the fast track to comprehensive surface analysis.

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Surface Properties

Surface analysis contributes to the understanding of each of these areas:

  • Corrosion
  • Welding
  • Fatigue
  • Grain boundary segregation
  • Glass
  • Coatings
  • Motor/Avionics
  • Lubrication
  • Corrosion
  • Oxidation
  • Fatigue/Failure
  • Fiber Composites
  • Adhesives
  • Semiconductor/ Microelectronics
  • Microcircuits
  • Ultra-thin Films
  • Soldering
  • Cleaning
  • Thin-film Stability
  • Barrier Layers
  • Lubrication
  • Chemical Industry
  • Plastics/Coatings
  • Catalysis
  • Fibers
  • Metal/Steel Industry
Diagram of information found in atomic layers with XPS surface analysis.
Common properties and processes as a function of material depth or thickness.


 

Testimonials – Solving materials problems with XPS analysis


Resources

 

Webinars
 

Understanding XPS images and depth profiles with Avantage Software - Part 2
By watching the webinar, you will learn how to use the right tools to understand multi-level data sets, such as depth profiles and images.

Understanding Surface Chemistry with Avantage Software
This webinar is designed to offer training to current users of Avantage software and act as an introduction to those unfamiliar with it.

Surface Analysis of Thin Films
Explore a number of applications for thin film coating analysis including forensic studies, graphene, multi-layered glass, coated fabrics and photovoltaics.

Understanding Metal Surfaces and Oxides
XPS delivers chemical state information from the topmost nanometers of a sample surface, enabling you to measure passivation coatings, understand catalyst chemistries, and develop bio-compatibility coatings.

Multi-technique Surface Analysis and Cluster Ion Sample Cleaning
We present how a dual mode ion source can be used for multi-technique sample analysis, showing the importance of sample cleaning and how depth profiles can be performed.

Characterizing Polymers with XPS
This webinar covers the basics of X-ray photoelectron spectroscopy, with a special emphasis on how it can be used in the field of polymer surface analysis. X-ray photoelectron spectroscopy is a powerful technique for the chemical analysis of the surface of materials.

 

Webinars
 

Understanding XPS images and depth profiles with Avantage Software - Part 2
By watching the webinar, you will learn how to use the right tools to understand multi-level data sets, such as depth profiles and images.

Understanding Surface Chemistry with Avantage Software
This webinar is designed to offer training to current users of Avantage software and act as an introduction to those unfamiliar with it.

Surface Analysis of Thin Films
Explore a number of applications for thin film coating analysis including forensic studies, graphene, multi-layered glass, coated fabrics and photovoltaics.

Understanding Metal Surfaces and Oxides
XPS delivers chemical state information from the topmost nanometers of a sample surface, enabling you to measure passivation coatings, understand catalyst chemistries, and develop bio-compatibility coatings.

Multi-technique Surface Analysis and Cluster Ion Sample Cleaning
We present how a dual mode ion source can be used for multi-technique sample analysis, showing the importance of sample cleaning and how depth profiles can be performed.

Characterizing Polymers with XPS
This webinar covers the basics of X-ray photoelectron spectroscopy, with a special emphasis on how it can be used in the field of polymer surface analysis. X-ray photoelectron spectroscopy is a powerful technique for the chemical analysis of the surface of materials.

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