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Semiconductor Analysis
ESD Failure Analysis
Electrostatic discharge (ESD) failure level determination for accurate and reliable qualification of semiconductor devices.
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Electrostatic discharge (ESD) causes localized increases in temperature that can damage small features and structures that make up today’s semiconductor devices and integrated circuits. As these structures and devices become smaller and more complex in design, isolating such electrical faults becomes more challenging. This means advanced and highly sensitive testing equipment is needed to ensure that these devices can survive electrostatic discharge. This equipment can also help to prove that devices are in compliance with national, international, and industry ESD test standards.
For example, the most common ESD compliance test, called human body model (HBM) testing, simulates the effect of a human discharging electrical energy into an electronic component. Another example is charged device model (CDM) testing, where a discharge is simulated coming from the device to an external point.
Thermo Fisher Scientific offers a range of equipment that suits all your ESD testing needs, including instruments for transmission-line pulse (TLP), HBM, and CDM testing. The exact tool required will depend on the size and complexity of the device, so be sure to visit our product pages on this website for more information.
Evaluwave™ software provides automated waveform analysis allowing instant verification of conformance to published standards. Annotated waveforms can be captured and stored for use in reporting and archival.
SEM image showing ESD damage to a devices Gate Oxide at 50,000x magnification. Hole size is roughly 50nm.
Evaluwave™ software provides automated waveform analysis allowing instant verification of conformance to published standards. Annotated waveforms can be captured and stored for use in reporting and archival.
SEM image showing ESD damage to a devices Gate Oxide at 50,000x magnification. Hole size is roughly 50nm.