K-Alpha X-ray Photoelectron Spectrometer

The Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer (XPS) System brings a new approach to surface analysis. Focused on delivering high-quality results using a streamlined workflow, the K-Alpha XPS System makes XPS operation simple and intuitive, with no sacrifice in terms of performance or capabilities.

State-of-the-art performance, reduced cost of ownership, increased ease of use, and high sample throughput make the K-Alpha XPS System ideal for a multi-user environment. The K-Alpha XPS System gives more researchers around the world access to surface analysis.

Webinar: Thermo Scientific K-Alpha XPS System

K-Alpha X-ray Photoelectron Spectrometer features

High-performance X-ray source

The X-ray monochromator allows selection of analysis area from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.

Optimized electron optics

The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.

Sample viewing

Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.

Insulator analysis

The patented dual-beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.

Depth profiling

Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.

Digital Control

Intuitive operation—guided by the Avantage data system—makes the K-Alpha XPS System ideal for both multi-user, shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.

Optional sample holders

Specialist sample holders for angle-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.

Specifications

Analyzer type	180° double-focusing hemispherical analyzer, 128-channel detector
X-ray source type	Monochromated, micro-focused, low-power Al K-Alpha X-ray source
X-ray spot size	50–400 µm (adjustable in 5 µm steps)
Depth profiling	EX06 ion source
Maximum Sample area	60x60 mm
Maximum sample thickness	20 mm
Vacuum system	Two turbo molecular pumps, with automated titanium sublimation pump and backing pump
Optional accessories	ADXPS sample holder, work function sample holder, glove box