X-Ray Photoelectron Spectrometer | Nexsa G2 X-Ray Photoelectron Spectrometer

X-ray photoelectron spectroscopy

The Thermo Scientific Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of experiments now possible. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications.

The Nexsa G2 System: An Introduction with Tim Nunney

Key Features

High-performance X-ray source

A new, low-power X-ray monochromator allows selection of the analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.

Optimized electron optics

The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.

Sample viewing

Bring sample features into focus with the Nexsa XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly using a fully focused XPS image.

Insulator analysis

The patented dual-beam flood source couples low-energy ion beams with very low-energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need for charge referencing, making the analysis of the data from insulating samples easy and reliable.

Depth profiling

Go beyond the surface with a standard ion source or MAGCIS, the optional dual-mode monatomic and gas cluster ion source; automated source optimization and gas handling ensure excellent performance and experimental reproducibility.

Optional sample holders

Specialist sample holders for angle-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.

Digital Control

Instrument control, data processing, and reporting are all controlled from the Windows Software-based Avantage data system.

NX sample heater module

Fully software-controlled sample heating option, enabling temperature-dependent studies.

Animation: Thermo Scientific Nexsa surface analysis system

Specifications

Analyzer type	180°, double-focusing, hemispherical analyzer with 128-channel detector
X-ray source type	Monochromated, micro-focused, low-power Al K-Alpha X-ray source
X-ray spot size	10–400 µm (adjustable in 5 µm steps)
Depth profiling	EX06 monatomic ion source or MAGCIS dual-mode ion source
Maximum Sample area	60 x 60 mm
Maximum sample thickness	20 mm
Vacuum system	Two turbo molecular pumps, with automated titanium sublimation pump and backing pump
Optional accessories	UPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, NX sample heating module, sample bias module, vacuum transfer module, adaptor for glove box integration

Resources

Videos
Webinars

Watch on-demand: Thermo Scientific Nexsa G2 Surface Analysis System Demo

You will learn how the Nexsa G2 XPS System can be used to investigate a wide range of materials using XPS, supported by the additional analysis techniques on the system: UV photoelectron spectroscopy (UPS), ion scattering spectroscopy (ISS), reflected electron energy loss spectroscopy (REELS), Raman spectroscopy, and more.

Videos